B. Akın Et Al. , "Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements," Materials Science in Semiconductor Processing , vol.170, 2024
Akın, B. Et Al. 2024. Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements. Materials Science in Semiconductor Processing , vol.170 .
Akın, B., ULUSOY, M., & ALTINDAL YERİŞKİN, S., (2024). Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements. Materials Science in Semiconductor Processing , vol.170.
Akın, Buket, MURAT ULUSOY, And SEÇKİN ALTINDAL YERİŞKİN. "Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements," Materials Science in Semiconductor Processing , vol.170, 2024
Akın, Buket Et Al. "Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements." Materials Science in Semiconductor Processing , vol.170, 2024
Akın, B. ULUSOY, M. And ALTINDAL YERİŞKİN, S. (2024) . "Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements." Materials Science in Semiconductor Processing , vol.170.
@article{article, author={Buket Akın Et Al. }, title={Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements}, journal={Materials Science in Semiconductor Processing}, year=2024}