Ertugrul-Uyar, R. Et Al. 2020. Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.22 , 19846-19851.

Ertugrul-Uyar, R., Buyukbas-Ulusan, A., & Tataroglu, A., (2020). Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.22, 19846-19851.

Ertugrul-Uyar, R., A. Buyukbas-Ulusan, And ADEM TATAROĞLU. "Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.22, 19846-19851, 2020

Ertugrul-Uyar, R. Et Al. "Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.22, pp.19846-19851, 2020

Ertugrul-Uyar, R. Buyukbas-Ulusan, A. And Tataroglu, A. (2020) . "Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.31, no.22, pp.19846-19851.

@article{article, author={R. Ertugrul-Uyar Et Al. }, title={Ionizing radiation effects on Au/TiO2/n-Si metal-insulator-semiconductor (MIS) structure}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2020, pages={19846-19851} }