Ö. SEVGİLİ Et Al. , "Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures," Physica B: Condensed Matter , vol.587, 2020
SEVGİLİ, Ö. Et Al. 2020. Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures. Physica B: Condensed Matter , vol.587 .
SEVGİLİ, Ö., Azizian-Kalandaragh, Y., & Allindal, S., (2020). Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures. Physica B: Condensed Matter , vol.587.
SEVGİLİ, ÖMER, YASHAR AZIZIAN-KALANDARAGH, And Semsettin Allindal. "Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures," Physica B: Condensed Matter , vol.587, 2020
SEVGİLİ, ÖMER Et Al. "Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures." Physica B: Condensed Matter , vol.587, 2020
SEVGİLİ, Ö. Azizian-Kalandaragh, Y. And Allindal, S. (2020) . "Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures." Physica B: Condensed Matter , vol.587.
@article{article, author={ÖMER SEVGİLİ Et Al. }, title={Frequency and voltage dependence of electrical and dielectric properties in metal-interfacial layer-semiconductor (MIS) type structures}, journal={Physica B: Condensed Matter}, year=2020}