TATAROĞLU, A. Et Al. 2014. Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.28 , 89-93.

TATAROĞLU, A., YILDIRIM, M., & Baran, H. M., (2014). Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.28, 89-93.

TATAROĞLU, ADEM, MERT YILDIRIM, And Halil Mert Baran. "Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor," MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.28, 89-93, 2014

TATAROĞLU, ADEM Et Al. "Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.28, pp.89-93, 2014

TATAROĞLU, A. YILDIRIM, M. And Baran, H. M. (2014) . "Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor." MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING , vol.28, pp.89-93.

@article{article, author={ADEM TATAROĞLU Et Al. }, title={Dielectric characteristics of gamma irradiated Au/SnO2/n-Si/Au (MOS) capacitor}, journal={MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING}, year=2014, pages={89-93} }