Altuntas, H. Et Al. 2009. A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range. MICROELECTRONICS RELIABILITY , vol.49, no.8 , 904-911.

Altuntas, H., Altindal, Ş., Shtrikman, H., & Ozcelik, S., (2009). A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range. MICROELECTRONICS RELIABILITY , vol.49, no.8, 904-911.

Altuntas, H. Et Al. "A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range," MICROELECTRONICS RELIABILITY , vol.49, no.8, 904-911, 2009

Altuntas, H. Et Al. "A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range." MICROELECTRONICS RELIABILITY , vol.49, no.8, pp.904-911, 2009

Altuntas, H. Et Al. (2009) . "A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range." MICROELECTRONICS RELIABILITY , vol.49, no.8, pp.904-911.

@article{article, author={H. Altuntas Et Al. }, title={A detailed study of current-voltage characteristics in Au/SiO2/n-GaAs in wide temperature range}, journal={MICROELECTRONICS RELIABILITY}, year=2009, pages={904-911} }