Efkere, H. İ. Et Al. 2018. The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si. JOURNAL OF MOLECULAR STRUCTURE , vol.1165 , 376-380.

Efkere, H. İ., Tataroğlu, A., Cetin, S. Ş., Topaloglu, N., Gonullu, M., & Ateş, H., (2018). The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si. JOURNAL OF MOLECULAR STRUCTURE , vol.1165, 376-380.

Efkere, HALİL Et Al. "The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si," JOURNAL OF MOLECULAR STRUCTURE , vol.1165, 376-380, 2018

Efkere, HALİL İ. Et Al. "The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si." JOURNAL OF MOLECULAR STRUCTURE , vol.1165, pp.376-380, 2018

Efkere, H. İ. Et Al. (2018) . "The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si." JOURNAL OF MOLECULAR STRUCTURE , vol.1165, pp.376-380.

@article{article, author={HALİL İBRAHİM EFKERE Et Al. }, title={The effect of thickness on the optical, structural and electrical properties of ZnO thin film deposited on n-type Si}, journal={JOURNAL OF MOLECULAR STRUCTURE}, year=2018, pages={376-380} }