Yalçın, Y. Et Al. 2023. Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.34, no.25 , 1786.

Yalçın, Y., Arslan, Ö., İldeş, C., Çokduygulular, E., Çetinkaya, Ç., & Kınacı, B., (2023). Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C. JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.34, no.25, 1786.

Yalçın, Yeşim Et Al. "Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C," JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.34, no.25, 1786, 2023

Yalçın, Yeşim Et Al. "Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.34, no.25, pp.1786, 2023

Yalçın, Y. Et Al. (2023) . "Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C." JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS , vol.34, no.25, p.1786.

@article{article, author={Yeşim Yalçın Et Al. }, title={Electrical and dielectric properties of RF sputtered nano Al2O3 film annealed at 400 °C}, journal={JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS}, year=2023, pages={1786} }