AKAY, D. Et Al. 2024. Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect. Radiation Physics and Chemistry , vol.216 .

AKAY, D., Alkan, S., Altin, Z., GÖKMEN, U., & BİLGE OCAK, S., (2024). Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect. Radiation Physics and Chemistry , vol.216.

AKAY, DEFNE Et Al. "Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect," Radiation Physics and Chemistry , vol.216, 2024

AKAY, DEFNE Et Al. "Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect." Radiation Physics and Chemistry , vol.216, 2024

AKAY, D. Et Al. (2024) . "Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect." Radiation Physics and Chemistry , vol.216.

@article{article, author={DEFNE AKAY Et Al. }, title={Electrical characterization of Al/SnO2/PbO/Si double layer MOS under the moderate radiation effect}, journal={Radiation Physics and Chemistry}, year=2024}