Isik, M. Et Al. 2012. Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements. SOLID STATE COMMUNICATIONS , vol.152, no.9 , 791-793.

Isik, M., Cetin, S. Ş., HASANLI, N., & Ozcelik, S., (2012). Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements. SOLID STATE COMMUNICATIONS , vol.152, no.9, 791-793.

Isik, M. Et Al. "Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements," SOLID STATE COMMUNICATIONS , vol.152, no.9, 791-793, 2012

Isik, M. Et Al. "Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements." SOLID STATE COMMUNICATIONS , vol.152, no.9, pp.791-793, 2012

Isik, M. Et Al. (2012) . "Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements." SOLID STATE COMMUNICATIONS , vol.152, no.9, pp.791-793.

@article{article, author={M. Isik Et Al. }, title={Optical constants of layered structured Ga0.75In0.25Se crystals from the ellipsometric measurements}, journal={SOLID STATE COMMUNICATIONS}, year=2012, pages={791-793} }