ALTINDAL, Ş. Et Al. 2010. Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures. Journal of Optoelectronics and Advanced Materials , vol.12, no.10 , 2139-2143.

ALTINDAL, Ş., Parlaktürk, F., TATAROĞLU, A., & BÜLBÜL, M. M., (2010). Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures. Journal of Optoelectronics and Advanced Materials , vol.12, no.10, 2139-2143.

ALTINDAL, ŞEMSETTİN Et Al. "Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures," Journal of Optoelectronics and Advanced Materials , vol.12, no.10, 2139-2143, 2010

ALTINDAL, ŞEMSETTİN Et Al. "Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures." Journal of Optoelectronics and Advanced Materials , vol.12, no.10, pp.2139-2143, 2010

ALTINDAL, Ş. Et Al. (2010) . "Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures." Journal of Optoelectronics and Advanced Materials , vol.12, no.10, pp.2139-2143.

@article{article, author={ŞEMSETTİN ALTINDAL Et Al. }, title={Temperature and frequency dependent dielectric properties of Au/Bi 4Ti3O12/SiO2/Si (MFIS) structures}, journal={Journal of Optoelectronics and Advanced Materials}, year=2010, pages={2139-2143} }