Dokme, İ. Et Al. 2008. Frequency and gate voltage effects on the dielectric properties of Au/SiO(2)/n-Si structures. MICROELECTRONIC ENGINEERING , vol.85, no.9 , 1910-1914.

Dokme, İ., ALTINDAL, Ş., & Gokcen, M., (2008). Frequency and gate voltage effects on the dielectric properties of Au/SiO(2)/n-Si structures. MICROELECTRONIC ENGINEERING , vol.85, no.9, 1910-1914.

Dokme, İLBİLGE, ŞEMSETTİN ALTINDAL, And Muharrem Gokcen. "Frequency and gate voltage effects on the dielectric properties of Au/SiO(2)/n-Si structures," MICROELECTRONIC ENGINEERING , vol.85, no.9, 1910-1914, 2008

Dokme, İLBİLGE Et Al. "Frequency and gate voltage effects on the dielectric properties of Au/SiO(2)/n-Si structures." MICROELECTRONIC ENGINEERING , vol.85, no.9, pp.1910-1914, 2008

Dokme, İ. ALTINDAL, Ş. And Gokcen, M. (2008) . "Frequency and gate voltage effects on the dielectric properties of Au/SiO(2)/n-Si structures." MICROELECTRONIC ENGINEERING , vol.85, no.9, pp.1910-1914.

@article{article, author={İLBİLGE DÖKME Et Al. }, title={Frequency and gate voltage effects on the dielectric properties of Au/SiO(2)/n-Si structures}, journal={MICROELECTRONIC ENGINEERING}, year=2008, pages={1910-1914} }