Yildirim, M. Et Al. 2017. Electrical and Dielectric Properties of a n-Si Schottky Barrier Diode with Bismuth Titanate Interlayer: Effect of Temperature. JOURNAL OF ELECTRONIC MATERIALS , vol.46, no.3 , 1895-1901.

Yildirim, M., Sahin, C., Altindal, Ş., & Durmus, P., (2017). Electrical and Dielectric Properties of a n-Si Schottky Barrier Diode with Bismuth Titanate Interlayer: Effect of Temperature. JOURNAL OF ELECTRONIC MATERIALS , vol.46, no.3, 1895-1901.

Yildirim, M. Et Al. "Electrical and Dielectric Properties of a n-Si Schottky Barrier Diode with Bismuth Titanate Interlayer: Effect of Temperature," JOURNAL OF ELECTRONIC MATERIALS , vol.46, no.3, 1895-1901, 2017

Yildirim, M. Et Al. "Electrical and Dielectric Properties of a n-Si Schottky Barrier Diode with Bismuth Titanate Interlayer: Effect of Temperature." JOURNAL OF ELECTRONIC MATERIALS , vol.46, no.3, pp.1895-1901, 2017

Yildirim, M. Et Al. (2017) . "Electrical and Dielectric Properties of a n-Si Schottky Barrier Diode with Bismuth Titanate Interlayer: Effect of Temperature." JOURNAL OF ELECTRONIC MATERIALS , vol.46, no.3, pp.1895-1901.

@article{article, author={M. Yildirim Et Al. }, title={Electrical and Dielectric Properties of a n-Si Schottky Barrier Diode with Bismuth Titanate Interlayer: Effect of Temperature}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2017, pages={1895-1901} }