Tekeli, Z. Et Al. 2008. The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures. MICROELECTRONIC ENGINEERING , vol.85 , 2316-2321.

Tekeli, Z., Altindal, Ş., Çakmak, M., Ozcelik, S., & Ozbay, E., (2008). The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures. MICROELECTRONIC ENGINEERING , vol.85, 2316-2321.

Tekeli, Z. Et Al. "The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures," MICROELECTRONIC ENGINEERING , vol.85, 2316-2321, 2008

Tekeli, Z. Et Al. "The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures." MICROELECTRONIC ENGINEERING , vol.85, pp.2316-2321, 2008

Tekeli, Z. Et Al. (2008) . "The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures." MICROELECTRONIC ENGINEERING , vol.85, pp.2316-2321.

@article{article, author={Z. Tekeli Et Al. }, title={The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0.3Ga0.7N/AlN/GaN heterostructures}, journal={MICROELECTRONIC ENGINEERING}, year=2008, pages={2316-2321} }