YÜKSELTÜRK, E. Et Al. 2018. The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device. 5th International Conference on Materials Science and Nanotechnology for Next Generation .

YÜKSELTÜRK, E., BENGİ, S., & BÜLBÜL, M. M., (2018). The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device . 5th International Conference on Materials Science and Nanotechnology for Next Generation

YÜKSELTÜRK, ESRA, SEDA BENGİ, And MEHMET MAHİR BÜLBÜL. "The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device," 5th International Conference on Materials Science and Nanotechnology for Next Generation, 2018

YÜKSELTÜRK, ESRA Et Al. "The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device." 5th International Conference on Materials Science and Nanotechnology for Next Generation , 2018

YÜKSELTÜRK, E. BENGİ, S. And BÜLBÜL, M. M. (2018) . "The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device." 5th International Conference on Materials Science and Nanotechnology for Next Generation .

@conferencepaper{conferencepaper, author={ESRA YÜKSELTÜRK Et Al. }, title={The effect of illumination on the electrical characterization of Al/HfO2/p-Si MOS device}, congress name={5th International Conference on Materials Science and Nanotechnology for Next Generation}, city={}, country={}, year={2018}}