H. H. KURT Et Al. , "Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device," JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.8, pp.3970-3977, 2016
KURT, H. H. Et Al. 2016. Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device. JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.8 , 3970-3977.
KURT, H. H., Tanriverdi, E., & KURT, E., (2016). Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device. JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.8, 3970-3977.
KURT, HATİCE, Evrim Tanriverdi, And EROL KURT. "Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device," JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.8, 3970-3977, 2016
KURT, HATİCE H. Et Al. "Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device." JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.8, pp.3970-3977, 2016
KURT, H. H. Tanriverdi, E. And KURT, E. (2016) . "Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device." JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.8, pp.3970-3977.
@article{article, author={HATİCE HİLAL YÜCEL Et Al. }, title={Theoretical and Experimental Exploration of Breakdown Phenomena in an Argon-Filled GaP Device}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2016, pages={3970-3977} }