Cetin, S. Ş. Et Al. 2020. Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer. SILICON , vol.12, no.12 , 2879-2883.

Cetin, S. Ş., Efkere, H. İ., Sertel, T., Tataroğlu, A., & Özçelik, S., (2020). Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer. SILICON , vol.12, no.12, 2879-2883.

Cetin, SAİME Et Al. "Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer," SILICON , vol.12, no.12, 2879-2883, 2020

Cetin, SAİME Ş. Et Al. "Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer." SILICON , vol.12, no.12, pp.2879-2883, 2020

Cetin, S. Ş. Et Al. (2020) . "Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer." SILICON , vol.12, no.12, pp.2879-2883.

@article{article, author={SAİME ŞEBNEM AYDIN Et Al. }, title={Electrical Properties of MOS Capacitor with TiO2/SiO2 Dielectric Layer}, journal={SILICON}, year=2020, pages={2879-2883} }