Gullu, H. Et Al. 2019. Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure. Journal of Materials Science: Materials in Electronics , vol.30, no.10 , 9814-9821.

Gullu, H., Bayraklı Sürücü, Ö., Terlemezoglu, M., Yildiz, D., & PARLAK, M., (2019). Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure. Journal of Materials Science: Materials in Electronics , vol.30, no.10, 9814-9821.

Gullu, H.H. Et Al. "Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure," Journal of Materials Science: Materials in Electronics , vol.30, no.10, 9814-9821, 2019

Gullu, H.H. Et Al. "Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure." Journal of Materials Science: Materials in Electronics , vol.30, no.10, pp.9814-9821, 2019

Gullu, H. Et Al. (2019) . "Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure." Journal of Materials Science: Materials in Electronics , vol.30, no.10, pp.9814-9821.

@article{article, author={H.H. Gullu Et Al. }, title={Frequency effect on electrical and dielectric characteristics of In/Cu 2 ZnSnTe 4 /Si/Ag diode structure}, journal={Journal of Materials Science: Materials in Electronics}, year=2019, pages={9814-9821} }