Demirezen, S. Et Al. 2011. On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods. MICROELECTRONICS RELIABILITY , vol.51, no.12 , 2153-2162.

Demirezen, S., Altindal, Ş., Ozcelik, S., & Ozbay, E., (2011). On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods. MICROELECTRONICS RELIABILITY , vol.51, no.12, 2153-2162.

Demirezen, S. Et Al. "On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods," MICROELECTRONICS RELIABILITY , vol.51, no.12, 2153-2162, 2011

Demirezen, S. Et Al. "On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods." MICROELECTRONICS RELIABILITY , vol.51, no.12, pp.2153-2162, 2011

Demirezen, S. Et Al. (2011) . "On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods." MICROELECTRONICS RELIABILITY , vol.51, no.12, pp.2153-2162.

@article{article, author={S. Demirezen Et Al. }, title={On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al0.22Ga0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods}, journal={MICROELECTRONICS RELIABILITY}, year=2011, pages={2153-2162} }