I. Orak Et Al. , "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage," CHINESE PHYSICS B , vol.26, no.2, 2017
Orak, I. Et Al. 2017. Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage. CHINESE PHYSICS B , vol.26, no.2 .
Orak, I., Kocyigit, A., & Alindal, S., (2017). Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage. CHINESE PHYSICS B , vol.26, no.2.
Orak, I., A. Kocyigit, And S. Alindal. "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage," CHINESE PHYSICS B , vol.26, no.2, 2017
Orak, I. Et Al. "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage." CHINESE PHYSICS B , vol.26, no.2, 2017
Orak, I. Kocyigit, A. And Alindal, S. (2017) . "Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage." CHINESE PHYSICS B , vol.26, no.2.
@article{article, author={I. Orak Et Al. }, title={Electrical and dielectric characterization of Au/ZnO/n-Si device depending frequency and voltage}, journal={CHINESE PHYSICS B}, year=2017}