Kınacı, B. Et Al. 2022. Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.13 , 10516-10523.

Kınacı, B., Bairam, C., Yalcin, Y., Cokduygulular, E., Çetinkaya, Ç., Efkere, H. İ., ... Özçelik, S.(2022). Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.13, 10516-10523.

Kınacı, BARIŞ Et Al. "Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage," JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.13, 10516-10523, 2022

Kınacı, BARIŞ Et Al. "Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.13, pp.10516-10523, 2022

Kınacı, B. Et Al. (2022) . "Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage." JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS , vol.33, no.13, pp.10516-10523.

@article{article, author={BARIŞ KINACI Et Al. }, title={Evaluation of dielectric properties of Au/TZO/n-Si structure depending on frequency and voltage}, journal={JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS}, year=2022, pages={10516-10523} }