Suzer, S. Et Al. 1999. XPS characterization of Bi and Mn collected on atom-trapping silica for AAS. APPLIED SPECTROSCOPY , vol.53, no.4 , 479-482.

Suzer, S., Ertas, N., & Ataman, O., (1999). XPS characterization of Bi and Mn collected on atom-trapping silica for AAS. APPLIED SPECTROSCOPY , vol.53, no.4, 479-482.

Suzer, S, NUSRET ERTAŞ, And OY Ataman. "XPS characterization of Bi and Mn collected on atom-trapping silica for AAS," APPLIED SPECTROSCOPY , vol.53, no.4, 479-482, 1999

Suzer, S Et Al. "XPS characterization of Bi and Mn collected on atom-trapping silica for AAS." APPLIED SPECTROSCOPY , vol.53, no.4, pp.479-482, 1999

Suzer, S. Ertas, N. And Ataman, O. (1999) . "XPS characterization of Bi and Mn collected on atom-trapping silica for AAS." APPLIED SPECTROSCOPY , vol.53, no.4, pp.479-482.

@article{article, author={S Suzer Et Al. }, title={XPS characterization of Bi and Mn collected on atom-trapping silica for AAS}, journal={APPLIED SPECTROSCOPY}, year=1999, pages={479-482} }