A. K. Bilgili Et Al. , "Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface," SILICON , vol.14, no.6, pp.3013-3018, 2022
Bilgili, A. K. Et Al. 2022. Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface. SILICON , vol.14, no.6 , 3013-3018.
Bilgili, A. K., Cagatay, R., ÖZTÜRK, M., & ÖZER, M., (2022). Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface. SILICON , vol.14, no.6, 3013-3018.
Bilgili, Ahmet Et Al. "Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface," SILICON , vol.14, no.6, 3013-3018, 2022
Bilgili, Ahmet K. Et Al. "Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface." SILICON , vol.14, no.6, pp.3013-3018, 2022
Bilgili, A. K. Et Al. (2022) . "Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface." SILICON , vol.14, no.6, pp.3013-3018.
@article{article, author={Ahmet Kursat Bilgili Et Al. }, title={Investigation of Electrical and Structural Properties of Ag/TiO2/n-InP/Au Schottky Diodes with Different Thickness TiO2 Interface}, journal={SILICON}, year=2022, pages={3013-3018} }