Değertekin, F. L. Et Al. 2007. Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe. International Symposium on Acoustical Imaging , (Japan), 215-222.

Değertekin, F. L., BALANTEKİN, M., & Onaran, A. G., (2007). Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe . International Symposium on Acoustical Imaging (pp.215-222). , Japan

Değertekin, F, MÜJDAT BALANTEKİN, And A Güçlü Onaran. "Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe," International Symposium on Acoustical Imaging, Japan, 2007

Değertekin, F L. Et Al. "Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe." International Symposium on Acoustical Imaging , Japan, pp.215-222, 2007

Değertekin, F. L. BALANTEKİN, M. And Onaran, A. G. (2007) . "Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe." International Symposium on Acoustical Imaging , Japan, pp.215-222.

@conferencepaper{conferencepaper, author={F Levent Değertekin Et Al. }, title={Quantitative Material Characterization and Imaging at Nanoscale using a New AFM Probe}, congress name={International Symposium on Acoustical Imaging}, city={}, country={Japan}, year={2007}, pages={215-222} }