Corekci, S. Et Al. 2016. Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness. JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.7 , 3278-3284.

Corekci, S., Dugan, S., Ozturk, M. K., Cetin, S. Ş., ÇAKMAK, M., Ozcelik, S., ... Ozbay, E.(2016). Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness. JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.7, 3278-3284.

Corekci, S. Et Al. "Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness," JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.7, 3278-3284, 2016

Corekci, S. Et Al. "Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness." JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.7, pp.3278-3284, 2016

Corekci, S. Et Al. (2016) . "Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness." JOURNAL OF ELECTRONIC MATERIALS , vol.45, no.7, pp.3278-3284.

@article{article, author={S. Corekci Et Al. }, title={Characterization of AlInN/AlN/GaN Heterostructures with Different AlN Buffer Thickness}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2016, pages={3278-3284} }