ÇAVDAR, Ş. Et Al. 2022. Investigation of Trap States, Series Resistance and Diode Parameters in Al/Gelatin/n-Si Schottky Diode by Voltage and Frequency Dependent Capacitance and Conductance Analysis. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.2 .

ÇAVDAR, Ş., Demirolmez, Y., TURAN, N., KORALAY, H., TUĞLUOĞLU, N., & ARDA, L., (2022). Investigation of Trap States, Series Resistance and Diode Parameters in Al/Gelatin/n-Si Schottky Diode by Voltage and Frequency Dependent Capacitance and Conductance Analysis. ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.2.

ÇAVDAR, ŞÜKRÜ Et Al. "Investigation of Trap States, Series Resistance and Diode Parameters in Al/Gelatin/n-Si Schottky Diode by Voltage and Frequency Dependent Capacitance and Conductance Analysis," ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.2, 2022

ÇAVDAR, ŞÜKRÜ Et Al. "Investigation of Trap States, Series Resistance and Diode Parameters in Al/Gelatin/n-Si Schottky Diode by Voltage and Frequency Dependent Capacitance and Conductance Analysis." ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.2, 2022

ÇAVDAR, Ş. Et Al. (2022) . "Investigation of Trap States, Series Resistance and Diode Parameters in Al/Gelatin/n-Si Schottky Diode by Voltage and Frequency Dependent Capacitance and Conductance Analysis." ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY , vol.11, no.2.

@article{article, author={ŞÜKRÜ ÇAVDAR Et Al. }, title={Investigation of Trap States, Series Resistance and Diode Parameters in Al/Gelatin/n-Si Schottky Diode by Voltage and Frequency Dependent Capacitance and Conductance Analysis}, journal={ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY}, year=2022}