Badali, Y. Et Al. 2018. Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures. JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.7 , 3510-3520.

Badali, Y., Nikravan, A., ALTINDAL, Ş., & USLU, İ., (2018). Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures. JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.7, 3510-3520.

Badali, Yosef Et Al. "Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures," JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.7, 3510-3520, 2018

Badali, Yosef Et Al. "Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures." JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.7, pp.3510-3520, 2018

Badali, Y. Et Al. (2018) . "Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures." JOURNAL OF ELECTRONIC MATERIALS , vol.47, no.7, pp.3510-3520.

@article{article, author={Yosef Badali Et Al. }, title={Effects of a Thin Ru-Doped PVP Interface Layer on Electrical Behavior of Ag/n-Si Structures}, journal={JOURNAL OF ELECTRONIC MATERIALS}, year=2018, pages={3510-3520} }