Thesis Type: Postgraduate
Institution Of The Thesis: Gazi University, Fen Bilimleri Enstitüsü, Turkey
Approval Date: 2022
Thesis Language: Turkish
Student: BUKET TURAN
Supervisor: Şükrü Çavdar
Open Archive Collection: AVESIS Open Access Collection
Abstract:
Pure and 5% and 10% by weight Cd doped ZnO thin films on glass were coated using the SILAR method. Structural characterization of thin films were done with X-ray diffractometer and scanning electron microscope. Capacitance (C-f) and conductance (G-f) values of thin films were measured in 1 V steps between 0-5 V, frequency range of 1 kHz- 1.5 MHz, at room temperature. Using these values, impedance (Z), real (Z') and imaginary (Z") parts of impedance and series resistance (Rs) values were calculated. According to the obtained results, as the doping ratio increased, the capacitance and conductance values increased; It was found that Z, Z' and Z" values increased as the doping ratio increased, but decreased with increasing frequency. It was seen that the values of Rs decreased depending on both the doping rate and the increasing frequency.
| Keyt Words : Semiconductor, ZnO, Cadmium, İmpedance |