An investigation of chaos in the RL-diode circuit using the BDS test

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Atıf İçin Kopyala

KASAP R., KURT E.

Journal of Applied Mathematics and Decision Sciences, cilt.2, sa.2, ss.193-199, 1998 (Scopus)

• Yayın Türü: Makale / Tam Makale
• Cilt numarası: 2 Sayı: 2
• Basım Tarihi: 1998
• Doi Numarası: 10.1155/s117391269800011x
• Dergi Adı: Journal of Applied Mathematics and Decision Sciences
• Derginin Tarandığı İndeksler: Scopus
• Sayfa Sayıları: ss.193-199
• Anahtar Kelimeler: BDS test, Chaos, RL-diode
• Gazi Üniversitesi Adresli: Evet

Özet

In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each e values. © Journal of Applied Mathematics & Decision Sciences.