On the profile of frequency dependent interface states and series resistance in Al/SiO2/P-Si (MisStructure)

SAĞLAM S., TAŞÇIOĞLU İ., ÖZBAY A.

5. Uluslararası Bilim Teknik Konferansı: Fiziğin Güncel Problemleri, 25 June 2008 - 27 June 2018, (Full Text)

• Publication Type: Conference Paper / Full Text
• Gazi University Affiliated: Yes