X-ray diffraction study and electrical properties of the metal complex Fe(II) including sodium oxalate ligand (Na2C2O4)


AYDOĞDU Y. , Yakuphanoglu F., Dagdelen F., Sekerci M., Aksoy I.

MATERIALS LETTERS, vol.57, no.1, pp.237-241, 2002 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 57 Issue: 1
  • Publication Date: 2002
  • Doi Number: 10.1016/s0167-577x(02)00772-3
  • Title of Journal : MATERIALS LETTERS
  • Page Numbers: pp.237-241

Abstract

The crystal structure, microstructure and electrical properties of the Fe(II) complex including sodium oxalate ligand (Na2C2O4) have been investigated. X-ray diffraction data shows that the sample is triclinic with the cell parameters a = 4.8283 Angstrom, b = 3.9195 Angstrom, c = 12.7633 Angstrom, beta = 97.818degrees and cell volume V = 239.30 Angstrom(3). The do conductivities have been measured as a function of temperature. It is seem that this sample has inorganic semiconductor property. (C) 2002 Elsevier Science B.V. All rights reserved.