Electrical and Dielectric Properties in identically fabricated Al/Bi3Ti4O12/n-Si (MFS) structures by Capacitance/Conductance-Voltage Measurements

ÇETİNKAYA H. G., ALTINDAL Ş.

2nd International Advanced and Functional Materials Technologies (AFMAT 2016), 20 - 22 Ekim 2016

  • Yayın Türü: Bildiri / Özet Bildiri
  • Gazi Üniversitesi Adresli: Evet