The effect of series resistance and interface states on the frequency dependent C-V and G/w-V characteristics of Al/perylene/p-Si MPS type Schottky barrier diodes

Zeyrek S., Acaroglu E., Altindal Ş., Birdogan S., Bulbul M. M.

CURRENT APPLIED PHYSICS, cilt.13, sa.7, ss.1225-1230, 2013 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 13 Sayı: 7
  • Basım Tarihi: 2013
  • Doi Numarası: 10.1016/j.cap.2013.03.014
  • Dergi Adı: CURRENT APPLIED PHYSICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.1225-1230
  • Anahtar Kelimeler: MPS Schottky barrier diodes (SBSs), Series resistance, Frequency and voltage dependence, Interface states density, Perylene (C20H12), CAPACITANCE-VOLTAGE CHARACTERISTICS, DIELECTRIC-PROPERTIES, ELECTRICAL CHARACTERISTICS, PHOTOVOLTAIC PROPERTIES, TEMPERATURE-DEPENDENCE, MOS STRUCTURES, SOLAR-CELLS, OXIDE FILMS, THIN-FILM, I-V
  • Gazi Üniversitesi Adresli: Evet

Özet

The capacitance-voltage-frequency (C-V-f) and conductance-voltage-frequency (G/w-V-f) characteristics of Al/perylene/p-Si Schottky barrier diodes (SBDs) fabricated with spin coating system have been investigated in the frequency range of 30 kHz-2 MHz at room temperature. In order to elucidate the electrical characteristics of SBDs with perylene interface, the voltage and frequency dependent series resistance (R-S), frequency dependent density distribution profile of interface state (N-SS) were obtained. The measurements of C and G/w were found to be strongly dependent on bias voltage and frequency for Al/perylene/p-Si SBDs. For each frequency, the R-S-V plot gives a peak, decreasing with increasing frequencies. Also, it has been shown that the interface states density exponentially decreases with increasing frequency. The C-V-f and G/w-V-f characteristics confirm that the N-SS and R-S of the diode are important parameters that strongly influence the electric parameters in metal/polymer/semiconductor (MPS) structure. (C) 2013 Elsevier B.V. All rights reserved.