Surface States, Series Resistance and Interfacial Bi4Ti3O12 Layer Effects on the Electrical and dielectric Properties of Al/Bi4Ti3O12/p-Si (MFS) Structure


ÇETİNKAYA H. G. , YILDIRIM M., DURMUŞ P. , ALTINDAL Ş.

4th Internatıonal conference on materials science and nanotechnology for next generation (MSNG2017), 28 - 30 Haziran 2017

  • Yayın Türü: Bildiri / Özet Bildiri