An investigation of chaos in the RL-diode circuit using the BDS test
Journal of Applied Mathematics and Decision Sciences, cilt.2, sa.2, ss.193-199, 1998 (Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 2 Sayı: 2
- Basım Tarihi: 1998
- Doi Numarası: 10.1155/s117391269800011x
- Dergi Adı: Journal of Applied Mathematics and Decision Sciences
- Derginin Tarandığı İndeksler: Scopus
- Sayfa Sayıları: ss.193-199
- Anahtar Kelimeler: BDS test, Chaos, RL-diode
- Açık Arşiv Koleksiyonu: AVESİS Açık Erişim Koleksiyonu
- Gazi Üniversitesi Adresli: Evet
Özet
In this paper, RL-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each e values. © Journal of Applied Mathematics & Decision Sciences.