In this research, the dielectric characteristics of fabricated Al/(ZnFe2O4-PVA)/p-Si structures have been investigated in wide range frequency and voltage. Thus, by deriving capacitance-conductance (C-G/omega) measurements the main parameters of the metal-polymer-semiconductor (MPS) structure such as complex dielectric constants (epsilon ' and epsilon ''), loss tangent (tan delta), complex electric modulus (M ' and M '') and ac electrical conductivity (sigma(ac)), were acquired at frequency and voltage ranges of 1 kHz-1 MHz and (+/- 5V). As a result of the experiment, it was observed that the presence of negative capacitance (NC) at low frequencies differently affects the dielectric properties of the structure. Although the NC effect disappeared at high frequencies by the reduction of the effect of many parameters such as series resistance (R-ss) and interface states (N-ss) with frequency increment, the dielectric properties of the structure varied especially in the reverse bias region. Ultimately, it has been observed that the dielectric properties of the structure are highly dependent on frequency, voltage, N-ss, and polarization.