Determination of poisson's ratio using growth temperature variations of InGaN/GaN MQW

Bilgili A. K., ÖZÇELİK S., Ozturk M.

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, cilt.31, sa.17, ss.14941-14945, 2020 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 31 Sayı: 17
  • Basım Tarihi: 2020
  • Doi Numarası: 10.1007/s10854-020-04055-6
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.14941-14945
  • Gazi Üniversitesi Adresli: Evet

Özet

In this study, InGaN/GaN/Al(2)O(3)multi-quantum well (MQW) structure is investigated in 300-450 degrees C growth temperature range with steps of 50 degrees C. By the help of lattice constants at four different growth temperatures strain values are gained. Plot of strain in a- versus strain in c- is used to determine Poisson's ratio for GaN in the structure. Poisson's ratio is determined as 0.36. Reciprocal space mapping (RSM) technique of X-ray diffraction (XRD) method is used to gain peak positions of the sample instead ofw-theta scans because it gives more accurate results. Shifts in peak positions by variations of growth temperatures are shown. Lattice parameter equations are used with tau modification angles which minimise the errors caused from tilt of c- in hexagonal unit cell. This work is original because Poisson's ratio of GaN is determined using a natural method, variations in growth temperatures. It is also emphasised that RSM is a more sensitive method of XRD for determining structural properties of nitrite-based semiconductors.