Quantitative mechanical characterization of materials at the nanoscale through direct measurement of time-resolved tip-sample interaction forces

Balantekin M., Onaran A. G., Degertekin F. L.

NANOTECHNOLOGY, cilt.19, sa.8, 2008 (SCI-Expanded) identifier identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 19 Sayı: 8
  • Basım Tarihi: 2008
  • Doi Numarası: 10.1088/0957-4484/19/8/085704
  • Dergi Adı: NANOTECHNOLOGY
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Gazi Üniversitesi Adresli: Hayır

Özet

We introduce a new method for material characterization at the nanoscale using a recently developed atomic force microscope (AFM) probe. The FIRAT (force sensing integrated readout and active tip) probe is integrated into a commercial AFM system to obtain time-resolved interaction forces (TRIFs) between the probe tip and sample at speeds suitable for nondestructive and fast imaging of material properties. We present a basic interaction model to extract the material elasticity and surface energy. Numerical simulations are performed and compared to the experimental results for three different polymers and a silicon sample. We find that our interaction model does not completely explain the observed long-range surface forces, but it agrees fairly well with the measurements during the tip-sample contact.