Measurement of foil and cable thicknesses by a transmission method


Ekinci N., Oz E. , Kurucu Y., Sahin Y.

INSTRUMENTATION SCIENCE & TECHNOLOGY, cilt.29, sa.5, ss.415-421, 2001 (SCI İndekslerine Giren Dergi) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 29 Konu: 5
  • Basım Tarihi: 2001
  • Doi Numarası: 10.1081/ci-100107233
  • Dergi Adı: INSTRUMENTATION SCIENCE & TECHNOLOGY
  • Sayfa Sayıları: ss.415-421

Özet

X-ray fluorescence analysis techniques can be applied to determine sample thickness by either absolute or relative methods. An absolute method for thickness determination by x-ray fluorescence analysis has been devised, based on two types of independent measurements of the fluorescence intensity of the constituents of the sample and performance of transmission and reflection irradiation setups.