Measurement of foil and cable thicknesses by a transmission method


Ekinci N., Oz E., Kurucu Y., Sahin Y.

INSTRUMENTATION SCIENCE & TECHNOLOGY, vol.29, no.5, pp.415-421, 2001 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 29 Issue: 5
  • Publication Date: 2001
  • Doi Number: 10.1081/ci-100107233
  • Journal Name: INSTRUMENTATION SCIENCE & TECHNOLOGY
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.415-421
  • Gazi University Affiliated: No

Abstract

X-ray fluorescence analysis techniques can be applied to determine sample thickness by either absolute or relative methods. An absolute method for thickness determination by x-ray fluorescence analysis has been devised, based on two types of independent measurements of the fluorescence intensity of the constituents of the sample and performance of transmission and reflection irradiation setups.