X-ray diffraction study and electrical properties of the metal complex Fe(II) including sodium oxalate ligand (Na2C2O4)


AYDOĞDU Y., Yakuphanoglu F., Dagdelen F., Sekerci M., Aksoy I.

MATERIALS LETTERS, vol.57, no.1, pp.237-241, 2002 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 57 Issue: 1
  • Publication Date: 2002
  • Doi Number: 10.1016/s0167-577x(02)00772-3
  • Journal Name: MATERIALS LETTERS
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Page Numbers: pp.237-241
  • Gazi University Affiliated: No

Abstract

The crystal structure, microstructure and electrical properties of the Fe(II) complex including sodium oxalate ligand (Na2C2O4) have been investigated. X-ray diffraction data shows that the sample is triclinic with the cell parameters a = 4.8283 Angstrom, b = 3.9195 Angstrom, c = 12.7633 Angstrom, beta = 97.818degrees and cell volume V = 239.30 Angstrom(3). The do conductivities have been measured as a function of temperature. It is seem that this sample has inorganic semiconductor property. (C) 2002 Elsevier Science B.V. All rights reserved.