the investigation of the frequency dependent profile of Te/NaF:CdS/SnO2 Schottky diodes


SEVGİLİ Ö., ALTINDAL Ş. , BACAKSIZ E.

4th international conference on materials science and nanotechnology for next generation, 28 - 30 Haziran 2017

  • Yayın Türü: Bildiri / Özet Bildiri