Analysis of interface states of FeO-Al2O3 spinel composite film/p-Si diode by conductance technique

TATAROĞLU, ADEM; Al-Ghamdi, Ahmed; El-Tantawy, Farid; Farooq, W.; Yakuphanoglu, F.

doi:10.1007/s00339-016-9782-7

Analysis of interface states of FeO-Al2O3 spinel composite film/p-Si diode by conductance technique

TATAROĞLU A., Al-Ghamdi A. A., El-Tantawy F., Farooq W. A., Yakuphanoglu F.

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, cilt.122, sa.3, 2016 (SCI-Expanded, Scopus)

Yayın Türü: Makale / Tam Makale
Cilt numarası: 122 Sayı: 3
Basım Tarihi: 2016
Doi Numarası: 10.1007/s00339-016-9782-7
Dergi Adı: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
Gazi Üniversitesi Adresli: Evet

Özet

The interface states and series resistance properties of the Al/FeO-Al2O3/p-Si diode were investigated by the capacitance (C) and conductance (G) measurements. The measured capacitance and conductance values were corrected to eliminate the effect of series resistance to obtain the real capacitance and conductance values of the diode. The C and G characteristics indicate the presence of interface states at the interface of the diode. The interface states density, N-ss, was determined using Hill-Coleman method, and it was found that the density of interface states is decreased with the frequency. The obtained results suggest that the series resistance and interface states affect significantly the electronic parameters of the Al/FeO-Al2O3/p-Si diode.