Electrical and Dielectric Properties in identically fabricated Al Bi3Ti4O 2ln Si MFS structures by Capaci tance Conductance Vol tage Measurements

ÇETİNKAYA H. G., ALTINDAL Ş.

2nd international Advanced a6d Functıoniı Materials Technologies (AFMAT) 2016, 20 - 22 Ekim 2016

  • Yayın Türü: Bildiri / Özet Bildiri
  • Gazi Üniversitesi Adresli: Evet