Electrical and Dielectric Properties in identically fabricated Al Bi3Ti4O 2ln Si MFS structures by Capaci tance Conductance Vol tage Measurements


ÇETİNKAYA H. G. , ALTINDAL Ş.

2nd international Advanced a6d Functıoniı Materials Technologies (AFMAT) 2016, 20 - 22 October 2016

  • Publication Type: Conference Paper / Summary Text