Determination of stress from HR-XRD and Raman for GaN/AlInN/AlN/Sapphire HEMTs


Bayal Ö., Bilgili A. K., Hekin E., Kaya N., Özen Y., Öztürk M. K.

Gazi University Journal of Science Part A: Engineering and Innovation, cilt.12, sa.1, ss.119-126, 2025 (TRDizin)