Beta Irradiation Effects on Electrical Characteristics of Graphene-doped PVA/n-type Si nanostructures


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Abay Ö., Gökmen U., Bilge Ocak S.

ACS OMEGA, cilt.1, sa.2, ss.1-13, 2024 (SCI-Expanded)

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 1 Sayı: 2
  • Basım Tarihi: 2024
  • Dergi Adı: ACS OMEGA
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Directory of Open Access Journals
  • Sayfa Sayıları: ss.1-13
  • Gazi Üniversitesi Adresli: Evet

Özet

This study investigates the beta irradiation’s impact on the electrical features of interfacial nanostructures composed of Polyvinyl Alcohol (PVA) doped with graphene. The integration of graphene, a two-dimensional carbon allotrope renowned for its exceptional electrical conductivity, into PVA nanostructures holds significant promise for advanced electronic applications. Beta irradiation, as a controlled method of introducing radiation, offers a unique avenue to modulate the properties of these nanostructures. Therefore, this study examines Au/3% Graphene(Gr)-doped PVA/n-type Si structure with and without beta (β) radiation. The effect of beta radiation on the electrical properties of the Au/3% Graphene(Gr)-doped PVA/n-type Si structure has been researched by utilizing the currentvoltage (I–V) data. The studied structures were exposed to a 90Sr β-ray source at room temperature to show the effect of the beta radiation. The series resistance (Rs), shunt resistance (Rsh), ideality factor (n), barrier height (ΦB0), and saturation current (Io) were computed by using the I–V data after 90 Sr βray irradiation (0 kGy, 6kGy, 18kGy) and before using the thermionic emission (TE), Norde, and Cheung methods. The barrier height, ideality factor, and series resistance were calculated by using the I-V data as follows: 0.888eV, 3.21, and 5.25 kΩ for 0 kGy; 0.782 eV, 5.30, and 3.47 kΩ for 6 kGy; 0.782eV, 5.46, and 2.63 kΩ for 18kGy. The barrier height, ideality factor, and series resistance were also calculated by using the Cheng Methods, and the following results were found respectively: 7.22, 0.74, and 3.97 kΩ (Cheng I), and 3.22 kΩ (Cheng II) for 0 kGy; 5.14, 0.813, and 2.72 kΩ (Cheng I), and 2.14 kΩ (Cheng II) for 6 kGy; 6.78, 0.721, and 1.96 kΩ (Cheng I), 1.64 kΩ (Cheng II) for 18 kGy. The barrier height and series resistance were defined as 0.905 and 16.12 kΩ for 0 kGy, 0.859 and 5.31 kΩ for 6 kGy, and 0.792 and 2.49 kΩ for 18 kGy, respectively. Interface states density (Nss) as a function of Ec-Ess, was also attained by taking into account the voltage dependence of n, ΦB, and Rs . Experimental results revealed that the values of n and Nss increased with the increase in the β-ray radiation dose. On the other hand, the saturation current (Io), ΦB0, and Rs values decreased with the increase in the β-ray radiation dose. The obtained results indicate a nuanced interplay between β irradiation dose and the nanostructure's overall electrical properties. Insights gained from this study contribute to the understanding of radiation-induced effects on graphene-doped polymer nanostructures, providing valuable information for optimizing their performance in the electronic applications