Electrical and Dielectric Properties in identically fabricated Al/Bi3Ti4O12/n-Si (MFS) structures by Capacitance/Conductance-Voltage Measurements

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ÇETİNKAYA H. G., ALTINDAL Ş.

2nd International Advanced and Functional Materials Technologies (AFMAT 2016), 20 - 22 Ekim 2016, (Özet Bildiri)

• Yayın Türü: Bildiri / Özet Bildiri
• Gazi Üniversitesi Adresli: Evet