Calculation of the x-ray fluorescence intensity and detector count rate for annular source geometry


Gunen A., Akkutay C., Arikan P.

APPLIED SPECTROSCOPY REVIEWS, vol.33, pp.133-150, 1998 (Peer-Reviewed Journal) identifier identifier

  • Publication Type: Article / Review
  • Volume: 33
  • Publication Date: 1998
  • Doi Number: 10.1080/05704929808002628
  • Journal Name: APPLIED SPECTROSCOPY REVIEWS
  • Journal Indexes: Science Citation Index Expanded, Scopus
  • Page Numbers: pp.133-150

Abstract

Expressions for X-ray fluorescence spectroscopy described in a previous paper, were extended for the calculation of the fluorescence intensity of a thin specimen, providing a detector count rate with a precision of better than 0.2%. The results are presented in the form of delta(xi(1)eta(1 - )xi(2)eta(2)) where eta(1) and eta(2) are the standard functions common to all cylindrical geometry systems of any size, delta, and where xi(1) and xi(2) are user calculable coefficients.