Calculation of the x-ray fluorescence intensity and detector count rate for annular source geometry

Gunen A., Akkutay C., Arikan P.

APPLIED SPECTROSCOPY REVIEWS, cilt.33, ss.133-150, 1998 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Derleme
  • Cilt numarası: 33
  • Basım Tarihi: 1998
  • Doi Numarası: 10.1080/05704929808002628
  • Dergi Adı: APPLIED SPECTROSCOPY REVIEWS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.133-150
  • Gazi Üniversitesi Adresli: Hayır

Özet

Expressions for X-ray fluorescence spectroscopy described in a previous paper, were extended for the calculation of the fluorescence intensity of a thin specimen, providing a detector count rate with a precision of better than 0.2%. The results are presented in the form of delta(xi(1)eta(1 - )xi(2)eta(2)) where eta(1) and eta(2) are the standard functions common to all cylindrical geometry systems of any size, delta, and where xi(1) and xi(2) are user calculable coefficients.