Comparative Study on the Frequency Dependent Dielectric Properties of Au/n-SiC Metal- Semiconductor (MS) and Au/Al2O3/n-SiC Metal-Insulator-Semiconductor (MIS) Structures


YÜCEDAĞ İ., ERSÖZ G., DEMİR A., ALTINDAL Ş.

The 25th annual international conference on composites/nanoengineering (ICCE-25), 16 - 22 Temmuz 2017

  • Yayın Türü: Bildiri / Özet Bildiri