Structural, optical and electrical properties of ZnxSn1-xS thin films deposited by chemical spray pyrolysis

Zaidi B., Houaidji N., Khadraoui A., Gagui S., Shekhar C., Ozenv Y., ...More

Journal of Nano Research, vol.61, pp.72-77, 2020 (SCI-Expanded) identifier identifier

  • Publication Type: Article / Article
  • Volume: 61
  • Publication Date: 2020
  • Doi Number: 10.4028/
  • Journal Name: Journal of Nano Research
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus, PASCAL, Aerospace Database, Applied Science & Technology Source, Communication Abstracts, Compendex, INSPEC, Metadex, Civil Engineering Abstracts
  • Page Numbers: pp.72-77
  • Keywords: ZnS, SnS, spray pyolysis, buffer layer, thin films, OPTIMIZATION, KESTERITE
  • Gazi University Affiliated: Yes


© 2020 Trans Tech Publications Ltd, Switzerland.In the present study, ZnxSn1-xS (x = 0, 0.25, 0.5, 0.75 and 1) thin film samples were deposited by ultrasonic spray pyrolysis technique on glass substrates at 350°C to investigate the effect of variation of Zn concentration (x) on the structural, morphological, optical and electrical properties of ZnxSn1-xS thin films. The films were deposited by varying Zn content in the starting solution. The films deposited were found to be amorphous having root mean square (RMS) roughness ranged from 18.2 to 93.5 nm. The optical characterization by UV-Vis spectroscopy showed that the transmittance and reflectance of all samples are lower than 12.2 % and 10 % respectively. The optical band gap was estimated from the reflectance and transmittance spectra are about 3.86 eV. The carrier mobility is ranged from 113 to 2600 cm2/v.s.