On the voltage dependent profiles of surface states and their relaxation times in Al/C29H32O17/p-Si (MPS) structure by using conductance method


YÜKSELTÜRK E., ERBİLEN TANRIKULU E. , ALTINDAL Ş.

5th International Conference on Materials Science and Nanotechnology For Next Generation (MSNG2018), 4 - 06 Ekim 2018