Testing Au, Ti and ZnMnO Metal and Alloys on Ge as a Buffer Layer For Opto-Electronic Devices


AKPINAR Ö., ÖZEN Y. , GÜLTEKİN A., DURMAZ Y., BARAN V., ÖZTÜRK M. , ...Daha Fazla

Turkish Physical Society 33th International Physics Congress (TFD33), 6 - 10 Eylül 2017